• DocumentCode
    2741815
  • Title

    Digital Filtering With Unreliable Molecular Electronics

  • Author

    Wang, Shuo ; Dai, Jianwei ; Wang, Lei

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT
  • fYear
    2008
  • fDate
    18-21 Aug. 2008
  • Firstpage
    891
  • Lastpage
    894
  • Abstract
    Molecular electronics such as silicon nanowires (NWs) and carbon nanotubes (CNTs) have emerged as the potential fabrics for building future nanocomputing systems. However, the non-ideal fabrication process and the consequent excessive defect rates make reliable molecular computing a challenging task. Existing solutions addressing this problem aim at achieving the absolute correctness, which becomes increasingly infeasible due to the prohibitive cost involved. It is noticed that in the context of signal processing applications, absolute correctness is generally unnecessary. This could relax the design constraints on defect tolerance in molecular-scale integration. In this paper, we propose a new approach based on defect-insensitive signal processing. By allowing molecular-scale DSP architectures to bear defects, the proposed framework achieves reliable signal processing while ensures the effectiveness of defect tolerance.
  • Keywords
    carbon nanotubes; digital filters; molecular electronics; nanowires; reliability; silicon; C; carbon nanotubes; defect tolerance; defect-insensitive signal processing; digital filtering; excessive defect rates; molecular electronics; molecular-scale DSP architecture; molecular-scale integration; nanocomputing system; nonideal fabrication process; silicon nanowires; Carbon nanotubes; Digital filters; Fabrication; Fabrics; Filtering; Molecular computing; Molecular electronics; Nanowires; Signal processing; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2008. NANO '08. 8th IEEE Conference on
  • Conference_Location
    Arlington, TX
  • Print_ISBN
    978-1-4244-2103-9
  • Electronic_ISBN
    978-1-4244-2104-6
  • Type

    conf

  • DOI
    10.1109/NANO.2008.267
  • Filename
    4617249