Title :
[Copyright notice]
Abstract :
The following topics are dealt with: FPGA; fault tolerance; RF design; analogue circuit; circuit testing; network-on chip; system-on-chip design; nanoscale integration; memory testing; advanced digital architecture; asynchronous circuit; logic synthesis; and test generation.
Keywords :
analogue circuits; asynchronous circuits; fault tolerance; field programmable gate arrays; integrated circuit design; integrated circuit testing; nanotechnology; network-on-chip; storage management chips; FPGA; RF design; advanced digital architecture; analogue circuit; asynchronous circuit; circuit testing; fault tolerance; logic synthesis; memory testing; nanoscale integration; network-on chip; system-on-chip design; test generation;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
Conference_Location :
Vienna
Print_ISBN :
978-1-4244-6612-2
DOI :
10.1109/DDECS.2010.5491741
