A Quantitative Approach for Analysis of Defect Tolerance in QCA

Author

Dai, Jianwei ; Wang, Lei ; Jain, Faquir

Author_Institution

Dept. of Electr. & Comput. Eng., Connecticut, Univ., Storrs, CT

fYear

2008

fDate

18-21 Aug. 2008

Firstpage

903

Lastpage

906

Abstract

Quantum dot cellular automata (QCA) is one of the emerging nanotechnologies for the design of next generation nanocomputing systems. However, excessive defects at the device level are expected to become a fundamental obstacle for achieving reliable computation in QCA-based integrated systems. In this paper, we present an information-theoretic approach to investigate the relationship between defect tolerance and the redundancy inherent in QCA systems. The proposed method allows us to evaluate the effectiveness of redundancy-based defect tolerance in a quantitative manner.

Keywords

cellular automata; information theory; nanoelectronics; quantum computing; quantum dots; reliability; QCA-based integrated systems; defect tolerance analysis; information theoretic approach; nanocomputing systems; nanotechnologies; quantum dot cellular automata; redundancy-based defect tolerance; reliable computating; CMOS technology; Circuits; Clocks; Electrons; Logic; Polarization; Quantum cellular automata; Quantum dots; Redundancy; Stationary state;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology, 2008. NANO '08. 8th IEEE Conference on

Conference_Location

Arlington, TX

Print_ISBN

978-1-4244-2103-9

Electronic_ISBN

978-1-4244-2104-6

Type

conf

DOI

10.1109/NANO.2008.270

Filename

4617252