• DocumentCode
    2741911
  • Title

    A 12-bit fully differential 2MS/s successive approximation analog-to-digital converter with reduced power consumption

  • Author

    Davidovic, M. ; Zach, G. ; Zimmermann, H.

  • Author_Institution
    Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2010
  • fDate
    14-16 April 2010
  • Firstpage
    399
  • Lastpage
    402
  • Abstract
    This paper presents a 12-bit fully differential successive approximation register analog-to-digital converter (ADC) operating at 2MS/s and designed for an optoelectronic range sensor as a system-on-chip device. The realized ADC uses several improvements to lower the power consumption to 10mW at 5V power supply and, at the same time, to increase the conversion rate up to the limits offered by the used 0.6μm process. The proposed interpolation network consists of partially segmented R-2R resistors ladder instead of the commonly used serial array to achieve lower power consumption as well as smaller active area. The fabricated chip occupies an active area of ~1.1mm2 excluding pads. Measurement data, resulting in an effective number of bits of 11.55 at 1MS/s and 11.2 at 2MS/s, conform to simulations. The maximum measured differential non-linearity and integral non-linearity accounts to +0.3/-0.6LSB and ±0.7LSB respectively.
  • Keywords
    analogue-digital conversion; interpolation; low-power electronics; optoelectronic devices; power consumption; resistors; system-on-chip; ADC; R-2R resistors ladder; differential nonlinearity; fabricated chip; fully differential successive approximation analog-to-digital converter; fully differential successive approximation register; integral nonlinearity; interpolation network; lower power consumption; optoelectronic range sensor; reduced power consumption; serial array; system-on-chip device; word length 12 bit; Analog-digital conversion; Capacitance; Capacitors; Energy consumption; Integrated circuit technology; Interpolation; Logic; Production; Semiconductor device measurement; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
  • Conference_Location
    Vienna
  • Print_ISBN
    978-1-4244-6612-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2010.5491744
  • Filename
    5491744