Infrared Optical Properties of Bi4-xNdxTi3O12 Thin Films Prepared by a Chemical Solution Method

Author

Ma, Jian Hua ; Xue, Jian Qiang ; Meng, Xiang Jian ; Sun, Jing Lan ; Lin, Tie ; Shi, Fu Wen ; Chu, Jun Hao

Author_Institution

Chinese Acad. of Sci., Shanghai

fYear

2006

fDate

18-22 Sept. 2006

Firstpage

454

Lastpage

454

Abstract

Infrared optical properties of Bi_4-xNd_xTi₃O₁₂ [BNT(x=0,0.25,0.50,0.75)] thin films have been investigated using the infrared spectroscopic ellipsometry in the wavelength range of 2.5-11.4mum (0.11-0.50eV). Their refractive index decreased and extinction coefficient increased as the wavelength increased. Both the refractive index and the extinction coefficient decreased as the concentration of Nd increased. In addition, the wavelength and Nd concentration dependence of the absorption coefficient showed the similar behavior to that of the extinction coefficient.

Keywords

bismuth compounds; extinction coefficients; ferroelectric thin films; infrared spectra; liquid phase deposition; neodymium compounds; Bi₄NdTi₃O₁₂; absorption coefficient; chemical solution method; electron volt energy 0.11 eV to 0.50 eV; extinction coefficient; infrared optical properties; infrared spectroscopic ellipsometry; refractive index; thin films; wavelength 2.5 micron to 11.4 micron; Bismuth; Chemicals; Extinction coefficients; Infrared spectra; Neodymium; Optical films; Optical refraction; Optical variables control; Refractive index; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on

Conference_Location

Shanghai

Print_ISBN

1-4244-0400-2

Electronic_ISBN

1-4244-0400-2

Type

conf

DOI

10.1109/ICIMW.2006.368662

Filename

4222396