DocumentCode
2742004
Title
THz Transmittance and Reflectance Spectroscopy on Security-relevant Materials using Synchrotron Radiation
Author
Ortolani, Michele ; Lee, Joon Sang ; Schade, Ulrich ; Hubers, H.W. ; Richter, H. ; Semenov, Alexander ; Osterloh, K. ; Richter, H. ; Beckmann, J.
Author_Institution
BESSY, Berlin
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
457
Lastpage
457
Abstract
Many attempts have been made to introduce THz detection systems for security inspection at check points. For all approaches the spectral characteristics of the most common materials of investigation are required both in reflectance and transmittance. We investigated a broad variety of materials, including explosives, polymers and drugs by using Fourier-Transform Spectroscopy and synchrotron radiation as a broadband THz source. The spectral properties are discussed with respect to the material density, thickness, grain size, and measurement geometry. We found strong dependence on the aforementioned parameters which have to be considered for time-domain and other laser-based detection systems.
Keywords
Fourier transform spectroscopy; electromagnetic wave transmission; reflectivity; submillimetre wave measurement; submillimetre wave spectroscopy; submillimetre waves; synchrotron radiation; Fourier transform spectroscopy; THz detection systems; THz reflectance spectroscopy; THz transmittance spectroscopy; security inspection; security relevant materials; synchrotron radiation; Drugs; Explosives; Grain size; Inspection; Optical materials; Polymers; Reflectivity; Security; Spectroscopy; Synchrotron radiation;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368665
Filename
4222399
Link To Document