• DocumentCode
    2742101
  • Title

    Rating of annual energy yield more sensitive to reference power than module technology

  • Author

    Zinsser, Bastian ; Makrides, George ; Schubert, Markus B. ; Georghiou, George E. ; Werner, Jürgen H.

  • Author_Institution
    Inst. fur Phys. Elektron., Univ. Stuttgart, Stuttgart, Germany
  • fYear
    2010
  • fDate
    20-25 June 2010
  • Abstract
    At present, many different photovoltaic (PV) technologies share the market. Especially investors want to know how much energy each of the PV technologies produces. This paper discusses the measured annual energy yield EAC of twelve PV technologies under different climatic conditions in Germany and Cyprus over three years of operation. In order to compare the annual yield of different PV technologies, the EAC data are normalized to the rated power PN, to the flasher power Pflash, and to the measured field power Pfield. An error analysis is done for both, the energy measurement EAC and the nominal power PSTC. It is found that the typical uncertainty for an energy yield comparison is ±5 %. This means that a difference of 10 % in the annual energy yield between PV technologies can not be traced back to the technologies themselves. The performance analysis of all PV systems shows that the differences in the energy yield are smaller than the error bars on the reference power. Therefore it is not yet possible to decide which PV technology is the best. Moreover, despite obvious trends on the data, we can not unambiguously conclude that PV modules with a better temperature or low light behavior will ensure a higher energy yield in general, since the propagation of state-of-the-art nominal power rating errors outbalances the well recognized effects of low light and temperature dependencies.
  • Keywords
    solar cells; annual energy yield; energy measurement; error analysis; module technology; nominal power; photovoltaic technologies; reference power; Europe; Films; Radiation effects; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2010 35th IEEE
  • Conference_Location
    Honolulu, HI
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-5890-5
  • Type

    conf

  • DOI
    10.1109/PVSC.2010.5614705
  • Filename
    5614705