Title :
Optical Properties of Ultra-thin Metal Films
Author :
Gompf, B. ; Brandt, T. ; Beister, J. ; Dressel, M. ; Drichko, N.
Author_Institution :
Univ. Stuttgart 1, Stuttgart
Abstract :
While the optical properties as well as the DC-conductivity of thicker metal films are well understood, little has been done at and below the metal-to-insulator transition (percolation threshold), especially in the infrared and far-infrared region. Here we present temperature dependent FTIR measurements on ultra-thin Au films on Si(111 ) in the thickness range between about one monolayer and 9 nm.
Keywords :
Fourier transform spectroscopy; electrical conductivity; gold; infrared spectroscopy; metallic thin films; optical properties; percolation; silicon; Au; DC-conductivity; FTIR measurements; Si; far-infrared region; metal-to-insulator transition; monolayer; optical properties; percolation threshold; ultra-thin Au films; ultra-thin metal films; Electromagnetic scattering; Frequency; Gold; Optical films; Optical scattering; Optical surface waves; Plasma applications; Plasma temperature; Surface cleaning; Surface reconstruction;
Conference_Titel :
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0400-2
Electronic_ISBN :
1-4244-0400-2
DOI :
10.1109/ICIMW.2006.368676
