DocumentCode
2742256
Title
A solution to support risk analysis on IT Change Management
Author
Wickboldt, Juliano Araújo ; Machado, Guilherme Sperb ; Cordeiro, Weverton Luis da Costa ; Lunardi, Roben Castagna ; Santos, Alan Diego dos ; Andreis, Fabrício Girardi ; Both, Cristiano Bonato ; Granville, Lisandro Zambenedetti ; Gaspary, Luciano Paschoal
Author_Institution
Inst. of Inf., UFRGS, Porto Alegre, Brazil
fYear
2009
fDate
1-5 June 2009
Firstpage
445
Lastpage
452
Abstract
The growing necessity of organizations in using technologies to support to their operations implies that managing IT resources became a mission-critical issue for the health of the primary companies´ businesses. Thus, in order to minimize problems in the IT infrastructure, possibly affecting the daily business operations, risks intrinsic to the change process have to be analyzed and assessed. Risk management is a widely discussed subject in several areas, although for IT change management it is quite a new discipline. The information technology infrastructure library (ITIL) introduces a set of best practices to conduct the management of IT infrastructures. According to ITIL, risks should be investigated, measured, and mitigated before any change is approved. Even with these guidelines, there is no default automatic method for risk assessment in IT change management. In this paper we introduce a risk analysis method based on the execution history of past changes. In addition, we propose a failure representation model to capture the feedback of the execution of changes over IT infrastructures.
Keywords
management of change; organisational aspects; risk analysis; IT change management; failure representation model; information technology infrastructure library; risk analysis; Best practices; Companies; Guidelines; Information technology; Libraries; Mission critical systems; Resource management; Risk analysis; Risk management; Technology management;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Network Management, 2009. IM '09. IFIP/IEEE International Symposium on
Conference_Location
Long Island, NY
Print_ISBN
978-1-4244-3486-2
Electronic_ISBN
978-1-4244-3487-9
Type
conf
DOI
10.1109/INM.2009.5188847
Filename
5188847
Link To Document