DocumentCode
2742321
Title
Studies of BaO-Nd2O3-TiO3 thin films by RF Sputter and its TMLs
Author
Bi-yan, Wu ; Shu-rong, Dong
Author_Institution
Zhejiang Gongshang Univ., Hangzhou
fYear
2006
fDate
18-22 Sept. 2006
Firstpage
473
Lastpage
473
Abstract
As a high permittivity and low loss ceramic, BaO-Nd2O3-TiO3 (BNT) is widely used in millimeter wave dielectric resonator. Perfect BNT thin films are obtained by through high density plasma RF sputter, and compared dielectric properties with bulk. The results show that underlay temperature has mainly effect on thin films. The optimize technology is gotten. Through simulation, thin film microstrip line based on BNT has more high integration and more excellent microwave dielectric loss properties than standard microstrip Line.
Keywords
barium compounds; ceramics; dielectric losses; dielectric resonators; dielectric thin films; microstrip lines; microwave materials; millimetre wave devices; neodymium compounds; permittivity; sputtered coatings; thin films; BNT thin films; BaO-Nd2O3-TiO3; RF sputter; high permittivity ceramic; low loss ceramic; microstrip line; microwave dielectric loss; millimeter wave dielectric resonator; Ceramics; Dielectric losses; Dielectric thin films; Microstrip; Millimeter wave technology; Permittivity; Plasma properties; Plasma temperature; Radio frequency; Sputtering; BNT; Thin Film Microstrip Line; dielectric ceramic; dielectric properties; millimeter wave;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics, 2006. IRMMW-THz 2006. Joint 31st International Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0400-2
Electronic_ISBN
1-4244-0400-2
Type
conf
DOI
10.1109/ICIMW.2006.368681
Filename
4222415
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