DocumentCode
2742481
Title
A 576k 3.5-ns access BiCMOS ECL static ram with array built-in self test
Author
Bonges, H.A. ; Adams, D. ; Allen, A. ; Flaker, R. ; Frederick, T. ; Gilbert, L. ; Gray, K. ; Hedberg, E. ; Holman, T. ; Lattimore, G. ; Lavalette, D. ; K.Nguyen ; Roberts, A.
Author_Institution
IBM General Technology Division
fYear
1991
fDate
May 30 1991-June 1 1991
Firstpage
13
Lastpage
14
Keywords
Automatic testing; BiCMOS integrated circuits; CMOS technology; Decoding; Driver circuits; Logic testing; Random access memory; Resistors; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on
Conference_Location
Oiso, Japan
Type
conf
DOI
10.1109/VLSIC.1991.760055
Filename
760055
Link To Document