• DocumentCode
    2742664
  • Title

    SREEP: Shift Register Equivalents Enumeration and Synthesis Program for secure scan design

  • Author

    Fujiwara, Katsuya ; Fujiwara, Hideo ; Obien, Marie Engelene J ; Tamamoto, Hideo

  • Author_Institution
    Fac. of Eng. & Resource Sci., Akita Univ. Akita, Akita, Japan
  • fYear
    2010
  • fDate
    14-16 April 2010
  • Firstpage
    193
  • Lastpage
    196
  • Abstract
    We reported a secure scan design approach using extended shift registers that are functionally equivalent but not structurally equivalent to shift registers. The security level of the secure scan architecture based on those shift register equivalents is determined by the probability that an attacker can identify the configuration of the shift register equivalent used in the circuit, and hence the attack probability approximates to the reciprocal of the cardinality of the class of shift register equivalents. In this paper, we clarify the cardinality of each class of shift register equivalents from several linear structured circuits and the cardinality of the whole class of shift register equivalents. We also consider the enumeration problem of shift register equivalents and the synthesis problem of desired shift register equivalents. A program called SREEP (Shift Register Equivalents Enumeration and Synthesis Program) is presented to solve those problems.
  • Keywords
    circuit reliability; logic design; shift registers; SREEP; linear structured circuits; secure scan architecture; secure scan design; shift register equivalents enumeration and synthesis program; Circuit faults; Circuit synthesis; Circuit testing; Design for testability; Digital circuits; Feedforward systems; Information security; Linear feedback shift registers; Protection; Shift registers; cardinality; enumeration; scan design; security; shift register equivalents; testability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
  • Conference_Location
    Vienna
  • Print_ISBN
    978-1-4244-6612-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2010.5491786
  • Filename
    5491786