Computer simulation of knife-edge field emission cathode performance

Author

Zeng, B.Q. ; Yang, Z.H. ; Xie, K.J. ; Yang, C.F.

Author_Institution

Res. Inst. of High Energy Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2000

fDate

12-15 Sept. 2000

Firstpage

77

Lastpage

78

Abstract

One of the potential advantages of vacuum field emission arrays (FEA) is that the FEA can produce high frequency modulated electron beams at high current densities. A knife-edge field emission array (KEFEA) structure has been built. The KEFEA cathode array consists of many knife field emitters, each with its own self-aligned surrounding gate. The initial tests of the KEFEA cathodes have shown a threshold bias voltage of less than 50 V. In this paper, the KEFEA emission performance has been studied by simulating a unit cell structure using the particle-in-cell simulation code MAGIC.

Keywords

arrays; cathodes; digital simulation; electrical engineering computing; electron field emission; vacuum microelectronics; 50 V; FEA emission performance; KEFEA cathode array; MAGIC; computer simulation; field emission cathode; high current densities; high frequency modulated electron beams; knife edge FEA; knife field emitters; knife-edge field emission array structure; particle-in-cell simulation code; self-aligned surrounding gate; threshold bias voltage; vacuum field emission arrays; Anodes; Capacitance; Cathodes; Current density; Electron beams; Elementary particle vacuum; Field emitter arrays; Optical modulation; Testing; Vacuum technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on

Conference_Location

Beijing, China

Print_ISBN

0-7803-6513-5

Type

conf

DOI

10.1109/ICIMW.2000.892943

Filename

892943