Title : 
Lateral- and thickness-field coupling in lithium tetraborate
         
        
            Author : 
Ballato, A. ; Kosinski, J. ; Mizan, M. ; Lukaszek, T.
         
        
            Author_Institution : 
US Army Electron. Telchnol. & Devices Lab., Fort Monmouth, NJ, USA
         
        
        
            fDate : 
31 May-2 Jun 1989
         
        
        
        
            Abstract : 
Calculations have previously been made for rotated y-cuts, including the regions where the quasi-extensional and quasi-shear thickness modes have zero temperature coefficients of frequency. This work extends the calculations to doubly rotated bulk-wave resonators, and computes the coupling factors for the three simple-thickness modes driven by thickness (TE) and lateral (LE) quasistatic electric fields as a function of the orientation angles φ and θ, and the direction of the applied lateral field ψ. Because of the temperature coefficients of the piezoelectric coupling factors, the temperature coefficient of a resonator depend not only upon orientation, but also upon harmonic number and location of the resonator operating point on the immittance circle. These considerations are addressed
         
        
            Keywords : 
crystal resonators; lithium compounds; piezoelectric materials; Li2B4O7 piezoelectric crystals; doubly rotated bulk-wave resonators; harmonic number; immittance circle; lateral-field coupling; orientation; orientation angles; piezoelectric coupling factors; quasistatic electric fields; resonator operating point; simple-thickness modes; temperature coefficients; thickness-field coupling; Acoustic waves; Delay effects; Frequency; Lithium; Ocean temperature; Optical resonators; Optical surface waves; Surface acoustic waves; Tellurium; Temperature dependence;
         
        
        
        
            Conference_Titel : 
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
         
        
            Conference_Location : 
Denver, CO
         
        
        
            DOI : 
10.1109/FREQ.1989.68917