A study for designing QC information system

The authors have been developing a quality information system for electron device manufacturing that aims at supporting total quality control (TQC) activities in design, manufacturing, and quality assurance by providing the capabilities of relational database (RDB) management and data analysis. The RDB for the quality control analysis contains all manufacturing data, such as data/time, station number, lot number, and measurement data, which are collected from the manufacturing floor through the data acquisition system. Users can search, extract, and join the data by using database query languages. For data analyses, a statistical analysis package and quality analysis graphic tool give the quality control chart on each terminal, so that process capability and the factor of defects in the process are easily found in a very short turnaround time. The authors propose a basic model of the electronic device process, which contains the process condition and measurement specification. They also discuss data structure in terms of the process model and database. The database query language and statistical data manipulation for the quality analysis are introduced, and a graphical representation tool is considered for easy understanding of the manufacturing quality status