• DocumentCode
    2743205
  • Title

    Bias voltages at microelectrodes change neural interface properties in vivo

  • Author

    Johnson, M.D. ; Otto, K.J. ; Williams, J.C. ; Kipke, D.R.

  • Author_Institution
    Dept. of Biomedical Eng., Michigan Univ., MI, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    4103
  • Lastpage
    4106
  • Abstract
    Rejuvenation of iridium microelectrode sites, which involves applying a 1.5 V bias for 4 s, has been shown to reduce site impedances of chronically implanted microelectrode arrays. This study applied complex impedance spectroscopy measurements to an equivalent circuit model of the electrode-tissue interface. Rejuvenation was found to cause a transient increase in electrode conductivity through an IrO2 layer and a decrease in the surrounding extracellular resistance by 85 ± 1% (n=73, t-test p < 0.001) and a decrease in the immediate site resistance by 44 ± 7% (n=73, t-test p<0.001). These findings may be useful as an intervention strategy to prolong the lifetime of chronic microelectrode implants for neuroprostheses.
  • Keywords
    bioelectric potentials; biological tissues; iridium; microelectrodes; neurophysiology; prosthetics; 1.5 V; 4 s; Ir; bias voltages; chronically implanted microelectrode arrays; complex impedance spectroscopy; electrode conductivity; electrode-tissue interface; equivalent circuit model; extracellular resistance; iridium microelectrode site rejuvenation; neural interface properties; neuroprostheses; site impedance reduction; Conductivity; Electrical resistance measurement; Electrochemical impedance spectroscopy; Electrodes; Equivalent circuits; Extracellular; Impedance measurement; In vivo; Microelectrodes; Voltage; bias voltage; microelectrodes; neural interface; neuroprostheses; rejuvenation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1404145
  • Filename
    1404145