A Low-power SRAM Utilizing High ON/OFF Ratio Laser-recrystallized SOI PMOSFET Load

Author

Takao, Y. ; Shimada, H. ; Suzuki, N. ; Matsukawa, Y. ; Kobayashi, Y. ; Sasaki, N.

Author_Institution

Fujitsu Limited

fYear

1991

fDate

May 30 1991-June 1 1991

Firstpage

Lastpage

Keywords

CMOS technology; Circuit testing; Equivalent circuits; Leakage current; MOS devices; MOSFET circuits; Random access memory; Thin film transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on

Conference_Location

Oiso, Japan

Type

DOI

10.1109/VLSIC.1991.760095

Filename

760095

Link To Document