Title :
A Low-power SRAM Utilizing High ON/OFF Ratio Laser-recrystallized SOI PMOSFET Load
Author :
Takao, Y. ; Shimada, H. ; Suzuki, N. ; Matsukawa, Y. ; Kobayashi, Y. ; Sasaki, N.
Author_Institution :
Fujitsu Limited
fDate :
May 30 1991-June 1 1991
Keywords :
CMOS technology; Circuit testing; Equivalent circuits; Leakage current; MOS devices; MOSFET circuits; Random access memory; Thin film transistors;
Conference_Titel :
VLSI Circuits, 1991. Digest of Technical Papers. 1991 Symposium on
Conference_Location :
Oiso, Japan
DOI :
10.1109/VLSIC.1991.760095
