• DocumentCode
    2743368
  • Title

    Intraoperative testing of selectivity of spiral nerve cuff electrodes

  • Author

    Polasek, Katharine H. ; Hoyen, Harry A. ; Kirsch, Robert F. ; Tyler, Dustin J.

  • Author_Institution
    Dept. of Biomedical Eng., Case Western Reserve Univ., Cleveland, OH, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-5 Sept. 2004
  • Firstpage
    4137
  • Lastpage
    4140
  • Abstract
    Nerve cuff electrodes were used intraoperatively to stimulate peripheral nerves to test electrode selectivity in the human upper extremity. Subjects were recruited from patients undergoing upper extremity nerve repair procedures. The nerves were stimulated through different contacts in the cuff and with varying parameters. Estimates of threshold and selectivity data were recorded. The stimulation thresholds found were an order of magnitude higher than prior animal studies using the spiral nerve cuff electrode. Preliminary selectivity was found on the ulnar nerve and the upper trunk of the brachial plexus of one subject. The biceps and pectoralis major were selectively activated by a single cuff placed proximally, on the upper trunk; the flexor carpi ulnaris and first dorsal interosseous were selectively activated by a single cuff placed on the ulnar nerve.
  • Keywords
    bioelectric phenomena; biomedical electrodes; neuromuscular stimulation; biceps; brachial plexus; dorsal interosseous; electrode selectivity; flexor carpi ulnaris; human upper extremity nerve repair; intraoperative testing; pectoralis major; peripheral nerve stimulation; spiral nerve cuff electrodes; ulnar nerve; Biomedical electrodes; Extremities; Humans; Injuries; Muscles; Parameter estimation; Recruitment; Spirals; Surgery; Testing; Electrical stimulation; e lectrodes; neural prosthesis; neural stimulation; peripheral nerve; spinal cord injury;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2004. IEMBS '04. 26th Annual International Conference of the IEEE
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-8439-3
  • Type

    conf

  • DOI
    10.1109/IEMBS.2004.1404154
  • Filename
    1404154