• DocumentCode
    2743412
  • Title

    Automated simulation-based verification of power requirements for Systems-on-Chips

  • Author

    Trummer, Christoph ; Kirchsteiger, Christoph M. ; Steger, Christian ; Weiß, Reinhold ; Pistauer, Markus ; Dalton, Damian

  • Author_Institution
    Inst. for Tech. Inf., Graz Univ. of Technol., Graz, Austria
  • fYear
    2010
  • fDate
    14-16 April 2010
  • Firstpage
    8
  • Lastpage
    11
  • Abstract
    Today power dissipation is the most important constraint for Systems-on-Chips (SoCs). Consequently, it is necessary to consider power in the requirements of mobile, battery-powered devices in which SoCs are often used. These power requirements describe battery lifetime, power constraints and low-power states. Verification ensures that the system fulfills the power requirements. However, verifying all requirements of the complex SoC design needs considerable effort. We introduce a methodology to reduce the verification effort through a high degree of automation. Our novel approach to verify battery lifetime, power constraints and the power aware design comprises three parts. First, a semi-formal use case format unifies specification of power and system requirements. Second, these specifications are used to automatically derive test cases and to generate a verification environment. Third, fast simulation and power estimation are employed to verify battery lifetime, power constraints and the power aware design against the requirements.
  • Keywords
    electronic engineering computing; formal verification; power electronics; system-on-chip; SoC design; automated simulation-based verification; battery-powered devices; mobile devices; power dissipation; power estimation; power requirements; systems-on-chips; Automation; Batteries; Computational modeling; Computer science; Computer simulation; Educational institutions; Hardware; Informatics; Power dissipation; Unified modeling language;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2010 IEEE 13th International Symposium on
  • Conference_Location
    Vienna
  • Print_ISBN
    978-1-4244-6612-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2010.5491829
  • Filename
    5491829