• DocumentCode
    2743440
  • Title

    Common Mode EMI Suppression Based on Simulated Annealing Algorithm

  • Author

    Zhang, Yonggao ; Zhang, Kai ; Zhou, Yunbin ; Kang, Yong

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., Wuhan
  • Volume
    2
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    8448
  • Lastpage
    8452
  • Abstract
    Different common mode (CM) EMI suppression methods are discussed and a parallel-connected active CM EMI suppression technique with digital closed-loop control is presented. A novel CM noise evaluation measure based on the energy of CM noise current is proposed. The relationship between the energy of CM noise current and the lead/lag time of compensating current is studied. It is shown that there are multiple local minimums on the relationship curve. Simulated annealing algorithm is used to search for the global minimum of CM noise energy. Simulation results show that CM EMI suppression based on simulated annealing algorithm (SAA) can regulate the phase of compensating current accurately without getting trapped at local minimums, suppress CM noise level effectively, and improve the EMC performance of power electronic products
  • Keywords
    closed loop systems; digital control; electromagnetic interference; interference suppression; power electronics; simulated annealing; common mode EMI suppression; compensating current; digital closed-loop control; global optimization; noise current; noise energy; noise evaluation; power electronic products; simulated annealing algorithm; Current measurement; Digital control; Electromagnetic compatibility; Electromagnetic interference; Electron traps; Energy measurement; Noise level; Noise measurement; Power electronics; Simulated annealing; common mode EMI suppression; global optimization; noise energy; simulated annealing algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Control and Automation, 2006. WCICA 2006. The Sixth World Congress on
  • Conference_Location
    Dalian
  • Print_ISBN
    1-4244-0332-4
  • Type

    conf

  • DOI
    10.1109/WCICA.2006.1713626
  • Filename
    1713626