DocumentCode :
2743455
Title :
Welcome
Author :
Jarrett, Dean
Author_Institution :
NIST Quantum Measurement Division, USA
fYear :
2012
fDate :
1-6 July 2012
Abstract :
It is my great pleasure to welcome you to our nation´s capital for the 2012 Conference on Precision Electromagnetic Measurements (CPEM 2012). Scientists and researchers from over 40 countries have registered to attend CPEM 2012, continuing the long-standing tradition of CPEM being the venue for technical exchange among international researchers and metrologists who are responsible for electromagnetic measurements at the highest levels of accuracy.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC, USA
ISSN :
0589-1485
Print_ISBN :
978-1-4673-0439-9
Type :
conf
DOI :
10.1109/CPEM.2012.6250628
Filename :
6250628
Link To Document :
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