Title :
Formal modeling and verification of integrated photonic systems
Author :
Siddique, Umair ; Hasan, Osman ; Tahar, Sofiene
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
Abstract :
The prominent advantages of photonics are high bandwidth, low power and the possibility of better electromagnetic interference immunity. As a result, photonics technology is increasingly used in ubiquitous applications such as telecommunication, medicine, avionics and robotics. One of the main critical requirements is to verify the corresponding functional properties of these systems. In this perspective, we identify the most widely used modeling techniques (e.g., transfer matrices, difference equations and block diagrams) for the modeling and analysis of photonic components. Considering the safety and cost critical nature of the application domain, we discuss the potential of using formal methods as a complementary analysis approach. In particular, we propose a framework to formally specify and verify the critical properties of complex photonic systems within the sound core of a higher-order-logic theorem prover. For illustration purposes, we present the formal specification of a microring resonator based photonic filter along with the verification of some important design properties such as spectral power and filtering rejection ratio.
Keywords :
difference equations; electromagnetic interference; integrated optics; block diagrams; difference equations; electromagnetic interference immunity; filtering rejection ratio; formal methods; higher-order-logic theorem; integrated photonic systems; microring resonator; photonic filter; photonics technology; spectral power; transfer matrices; ubiquitous applications; Analytical models; Difference equations; Integrated circuit modeling; Mathematical model; Optical resonators; Photonics; Transmission line matrix methods;
Conference_Titel :
Systems Conference (SysCon), 2015 9th Annual IEEE International
Conference_Location :
Vancouver, BC
DOI :
10.1109/SYSCON.2015.7116811