Improvements of the 10 V CENAM Josephson Voltage Standard to reach a standard uncertainty at 1 nV level

Author

Avilés, David ; Navarrete, Enrique ; Hernández, Dionisio

Author_Institution

Centro Nac. de Metrol., Mexico City, Mexico

fYear

2012

fDate

1-6 July 2012

Firstpage

66

Lastpage

67

Abstract

The CENAM Josephson Voltage Standard (JVS) was purchased in 1994. During its 18 years of use, several improvements have allowed to reduce noise immunity, measurements dispersion and uncertainty. During this period we participated in several international comparisons, the results show the improvements of the JVS. The current combined uncertainty of the CENAM JVS is 1.3 nV as a DC voltage measurement system. The difference between the CENAM JVS and the BIPM JVS during the direct on-site comparison [1] was found to be equal to - 0.6 nV. The uncertainty of the difference is under evaluation.

Keywords

measurement standards; measurement uncertainty; voltage measurement; BIPM JVS; CENAM Josephson voltage standard uncertainty; DC voltage measurement system; JVS; current combined uncertainty; measurement dispersion; measurement uncertainty; noise immunity reduction; time 18 year; voltage -0.6 nV; voltage 1.3 nV; voltage 10 V; Detectors; Laboratories; Measurement uncertainty; NIST; Uncertainty; Voltage measurement; DC voltage measurement; Josephson voltage standard; measurement standards; measurement techniques; measurement uncertainty; precision measurements; uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250663

Filename

6250663