Title :
Direct comparison of Josephson Voltage Standards at 10 V between BIPM and CENAM
Author :
Avilés, David ; Navarrete, Enrique ; Hernández, Dionisio ; Solve, Stéphane ; Chayramy, Régis
Author_Institution :
Centro Nac. de Metrol. (CENAM), Mexico City, Mexico
Abstract :
A direct comparison of Josephson Voltage Standards (JVS) at 10 V between the Bureau International des Poids et Mesures (BIPM) and the Centro Nacional de Metrología (CENAM), México, was carried out in September 2011. This comparison is part of the BIPM key comparisons (BIPM.EM-K10.b), and took place in the new DC voltage laboratory of CENAM. The relative voltage difference between the two quantum standards was -6 parts in 1011 (-0.6 nV), with a relative Type A uncertainty of 4.5 parts in 1011 (0.45 nV). The total combined uncertainty of the comparison is under evaluation.
Keywords :
measurement standards; measurement uncertainty; voltage measurement; BIPM; Bureau International des Poids et Mesures; CENAM; Centro Nacional de Metrología; DC voltage laboratory; JVS; Josephson voltage standard; México; quantum standard; relative type A uncertainty; relative voltage difference; voltage 10 V; Detectors; Measurement uncertainty; Semiconductor device measurement; Software; Standards; Uncertainty; Voltage measurement; DC voltage measurement; DC voltage measurement standard; Josephson voltage standard; Measurement; measurement uncertainty; standards comparison;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250664
