DocumentCode :
2744156
Title :
Author index
fYear :
2010
fDate :
22-27 Aug. 2010
Firstpage :
129
Lastpage :
129
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in System Testing and Validation Lifecycle (VALID), 2010 Second International Conference on
Conference_Location :
Nice
Print_ISBN :
978-1-4244-7784-5
Electronic_ISBN :
978-0-7695-4146-4
Type :
conf
DOI :
10.1109/VALID.2010.28
Filename :
5614870
Link To Document :
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