DocumentCode
2744156
Title
Author index
fYear
2010
fDate
22-27 Aug. 2010
Firstpage
129
Lastpage
129
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
Advances in System Testing and Validation Lifecycle (VALID), 2010 Second International Conference on
Conference_Location
Nice
Print_ISBN
978-1-4244-7784-5
Electronic_ISBN
978-0-7695-4146-4
Type
conf
DOI
10.1109/VALID.2010.28
Filename
5614870
Link To Document