A method for the complex residual errors of a VNA in one-port measurements

Author

Kim, Jeong-Hwan ; Kang, Jin-Seob ; Kwon, Jae-Yong ; Kim, Dae-Chan

Author_Institution

Center for Electromagn. Wave, Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea

fYear

2012

fDate

1-6 July 2012

Firstpage

112

Lastpage

113

Abstract

This paper shows that a method using multiple air lines for estimating the complex residual errors of a VNA (Vector Network Analyzer) being calibrated by an `OSL´ (Open-Short-Load) technique, which is widely used for one-port measurements, can be applied to the case when an adapter should be used for the connection of air lines and calibration standards. It uses a simple circle fit algorithm, together with some techniques to be used for improving the accuracy in finding the center and radius of a circle in the complex reflection coefficient plane from measured calibration data.

Keywords

calibration; measurement systems; network analysers; OSL technique; VNA; calibration standard; circle fit algorithm; complex reflection coefficient plane; complex residual error estimation; multiple air lines; one-port measurement; open-short-load technique; vector network analyzer; Accuracy; Atmospheric modeling; Calibration; Measurement uncertainty; Reflection; Standards; Vectors; ‘OSL’ technique; Vector network analyzer; air lines; calibration; circle fit; reflection coefficient measurements; residual errors;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM), 2012 Conference on

Conference_Location

Washington, DC

ISSN

0589-1485

Print_ISBN

978-1-4673-0439-9

Type

conf

DOI

10.1109/CPEM.2012.6250686

Filename

6250686