Title :
Ultrafast gain and refractive index dynamics of semiconductor amplifiers measured by four-wave mixing
Author :
D´Ottavi, A. ; Iannone, Eugenio ; Mecozzi, A. ; Scotti, S. ; Spano, P. ; Dall´Ara, R. ; Guekos, G. ; Eckner, J.
Author_Institution :
Fondazione Ugo Bordoni, Rome, Italy
Abstract :
Measurements of four-wave mixing in traveling wave semiconductor optical amplifiers are extended up to frequency detunings between pump and probe as high as 4.3 THz. The 35 fs equivalent time resolution is, to our knowledge, the highest achieved to date. Experimental evidence of nonlinear processes faster than spectral hole burning is obtained for the first time by using a frequency domain technique.
Keywords :
high-speed optical techniques; laser tuning; laser variables measurement; multiwave mixing; optical hole burning; refractive index; semiconductor lasers; travelling wave amplifiers; 35 fs; 4.3 THz; four-wave mixing; frequency detunings; frequency domain technique; nonlinear processes; refractive index dynamics; semiconductor amplifiers; spectral hole burning; time resolution; traveling wave semiconductor optical amplifier; ultrafast gain; Gain measurement; Nonlinear optics; Optical amplifiers; Optical mixing; Optical pumping; Optical saturation; Probes; Refractive index; Semiconductor optical amplifiers; Stimulated emission;
Conference_Titel :
Semiconductor Laser Conference, 1994., 14th IEEE International
Conference_Location :
Maui, HI, USA
Print_ISBN :
0-7803-1754-8
DOI :
10.1109/ISLC.1994.518920
