DocumentCode :
2744599
Title :
Improvement of non-resonant perturbation measurement using S-matrix data
Author :
Soukhov, N.V. ; Sun-Shin Jung ; Gun-Sik Park
Author_Institution :
Vacuum Electrophys. Lab., Seoul Nat. Univ., South Korea
fYear :
2000
fDate :
12-15 Sept. 2000
Firstpage :
335
Lastpage :
336
Abstract :
We report on the possibility of improving the phase measurements for the non-resonant perturbation techniques for estimating of the characteristic or interaction impedance in waveguides and slow wave structures. The measurement of the characteristic or interaction impedance is usually based on the nonresonant perturbation theory, which relates a normalized electromagnetic field strength with a small variations of the propagation constant between the perturbed and unperturbed circuit.
Keywords :
S-matrix theory; S-parameters; electric impedance measurement; microwave measurement; perturbation techniques; phase measurement; slow wave structures; waveguides; 8 to 15 GHz; S-matrix data; characteristic impedance; interaction impedance; non-resonant perturbation measurement; nonresonant perturbation theory; normalized electromagnetic field strength; perturbed circuit; phase measurements; propagation constant variation; slow wave structures; unperturbed circuit; waveguides; Books; Circuits; Cutoff frequency; Electromagnetic measurements; Electromagnetic waveguides; Frequency measurement; Impedance measurement; Phase measurement; Scattering parameters; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves, 2000. Conference Digest. 2000 25th International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-6513-5
Type :
conf
DOI :
10.1109/ICIMW.2000.893053
Filename :
893053
Link To Document :
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