DocumentCode
2744606
Title
Temperature and output power dependence of carrier overflow and internal loss in InGaAs/InGaAsP multiple quantum well lasers
Author
Tessler, N. ; Mikhaelashvili, V. ; Nagar, R. ; Eisenstein, G. ; Dentai, A.G. ; Joyner, C.H. ; Chandrasekhar, S.
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
fYear
1994
fDate
19-23 Sep 1994
Firstpage
67
Lastpage
68
Abstract
The authors demonstrate temperature and output power dependence of internal loss in multiple quantum well lasers resulting from carrier overflow effects
Keywords
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser beams; optical losses; quantum well lasers; waveguide lasers; InGaAs-InGaAsP; InGaAs/InGaAsP; carrier overflow; carrier overflow effects; internal loss; multiple quantum well lasers; output power dependence; temperature dependence; Capacitive sensors; Density measurement; Indium gallium arsenide; Length measurement; Loss measurement; Power generation; Predictive models; Temperature dependence; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference, 1994., 14th IEEE International
Conference_Location
Maui, HI
Print_ISBN
0-7803-1754-8
Type
conf
DOI
10.1109/ISLC.1994.518922
Filename
518922
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