• DocumentCode
    2744617
  • Title

    Comparative study of temperature influence on Thick film and Wire wound precision HV resistive divider

  • Author

    Ravat, K.B.

  • Author_Institution
    Nat. Phys. Lab., New Delhi, India
  • fYear
    2012
  • fDate
    1-6 July 2012
  • Firstpage
    136
  • Lastpage
    137
  • Abstract
    This paper focused to temperature influence of Thick film and Wire wound High voltage resistive divider. The deviation in resistance value depends upon the material used in resistance, type of construction and its coefficients. The temperature coefficient play significant role in calibration. The construction of HV divider reduces the temperature coefficient minimum by choosing some resistance with positive and other negative temperature coefficient. When these resistances are arranged in series, the total resistance changes for lower than that of individual but still influenced with the working temperature of HV divider. The study of deviation due to environment temperature from 20°C to 30°C of Thick film divider and Wire wound divider up to 100 kV dc under stable condition of source traceable from National Standard. The nominal scale factor of both dividers are 10000:1, the comparative study investigate the influence of temperature in wire wound resistive divider is 5 ppm/°C where as thick film resistive divider have 1 ppm/°C.
  • Keywords
    electric resistance; measurement standards; temperature; thick film resistors; voltage dividers; voltage measurement; National Standard; high voltage resistive divider; temperature 20 C to 30 C; temperature coefficient; temperature influence; thick film resistive divider; total resistance; voltage 100 kV; wire wound precision resistive divider; Resistance; Temperature; Temperature measurement; Thick films; Voltage measurement; Wires; Wounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM), 2012 Conference on
  • Conference_Location
    Washington, DC
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4673-0439-9
  • Type

    conf

  • DOI
    10.1109/CPEM.2012.6250698
  • Filename
    6250698