DocumentCode
2745156
Title
A step closer towards maintenance free gear
Author
Loucks, David
Author_Institution
Eaton Corp., Moon Township, PA, USA
fYear
2011
fDate
19-23 June 2011
Firstpage
67
Lastpage
74
Abstract
A difficult to predict electrical failure is the continuity failure. Pressure junctions are common problem sources for continuity failures. Available tools to search for pressure junction problems include low resistance testing, temperature monitoring using physical contact between sensor and heated part, pyrometer temperature monitoring, infrared photography and visual inspection. While each method is effective, each of these methods has one or more disadvantages. This paper will describe a breakthrough patented method of directly calculating conductor and pressure junction impedance, resistance and reactance, using the noisy, harmonic laden, switching transient laced (in other words, normal) load current flowing through an electrical distribution system. This technique, then, provides the solution to the problem of how to detect a conductor path impedance change of only a few tens of micro-ohms using conventional protective and metering devices without the need to de-energize the equipment or without the need to inject currents.
Keywords
electric impedance measurement; failure analysis; power apparatus; pyrometers; conductor path impedance change; continuity failure; electrical distribution system; electrical failure; infrared photography; load current; low resistance testing; maintenance free gear; metering devices; physical contact; pressure junction problems; pressure junctions; protective devices; pyrometer temperature monitoring; visual inspection; Conductors; Electrical resistance measurement; Impedance; Junctions; Resistance; Temperature measurement; Temperature sensors; arc flash; continuous; glowing contact; junction resistance calculation; loosening connection; online;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulp and Paper Industry Technical Conference (PPIC), Conference Record of 2011 Annual IEEE
Conference_Location
Nashville, TN
ISSN
0190-2172
Print_ISBN
978-1-61284-272-1
Type
conf
DOI
10.1109/PPIC.2011.5983252
Filename
5983252
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