Title :
Measurement of current and charge on thin (bent-wire) and V-cross scatterers
Author :
Duff, Bob M. ; Singarayar, Santiago
Author_Institution :
University of Mississippi, University, MS, USA
Keywords :
Charge measurement; Current measurement; Distributed computing; Geometry; Lighting; Probes; Scattering; Testing; Wires;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1975
DOI :
10.1109/APS.1975.1147441
