DocumentCode

2745323

Title

A New Insight Into Correlation Between DC And AC Hot-carrier Degradation Of MOS Devices

Author

Quader, K.N. ; Ko, P.K. ; Chenmning Hu

Author_Institution

University of California

fYear

1993

fDate

17-19 May 1993

Firstpage

13

Lastpage

14

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIT.1993.760221

Filename

760221