Title :
A New Insight Into Correlation Between DC And AC Hot-carrier Degradation Of MOS Devices
Author :
Quader, K.N. ; Ko, P.K. ; Chenmning Hu
Author_Institution :
University of California
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIT.1993.760221
