DocumentCode
2745477
Title
Negative Bias Temperature Instability In Poly-Si TFTs
Author
Maeda, S. ; Maegawa, S. ; Ipposhi, T. ; Nishimura, H. ; Ichiki, T. ; Mitsubashi ; Ashida, M. ; Muragishi, T. ; Nishimura, T.
Author_Institution
LSI Laboratory Mitsubishi Electric Corporation
fYear
1993
fDate
17-19 May 1993
Firstpage
29
Lastpage
30
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location
Kyoto, Japan
Type
conf
DOI
10.1109/VLSIT.1993.760229
Filename
760229
Link To Document