DocumentCode :
2745515
Title :
A New Scaling Methodology For The 0.1 - 0.025/spl mu/m MOSFET
Author :
Fiegna, C. ; Iwai, H. ; Wada, T. ; Saito, T. ; Sangiorgi, E. ; Ricco, B.
Author_Institution :
Toshiba Corporation
fYear :
1993
fDate :
17-19 May 1993
Firstpage :
33
Lastpage :
34
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
Type :
conf
DOI :
10.1109/VLSIT.1993.760231
Filename :
760231
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2745515
