DocumentCode

2745515

Title

A New Scaling Methodology For The 0.1 - 0.025/spl mu/m MOSFET

Author

Fiegna, C. ; Iwai, H. ; Wada, T. ; Saito, T. ; Sangiorgi, E. ; Ricco, B.

Author_Institution

Toshiba Corporation

fYear

1993

fDate

17-19 May 1993

Firstpage

33

Lastpage

34

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on

Conference_Location

Kyoto, Japan

Type

conf

DOI

10.1109/VLSIT.1993.760231

Filename

760231