Title :
Experimental Study Of Threshold Voltage Fluctuations Using An 8k MOSFET´s Array
Author :
Mizuno, T. ; Okamura, J. ; Toriumi, A.
Author_Institution :
Toshiba Corporation
Conference_Titel :
VLSI Technology, 1993. Digest of Technical Papers. 1993 Symposium on
Conference_Location :
Kyoto, Japan
DOI :
10.1109/VLSIT.1993.760235
