Title :
A parameterized VHDL library for on-line testing
Author :
Stroud, C. ; Ding, M. ; Seshadri, Sangeetha ; Kim, I. ; Roy, S. ; Wu, S. ; Karri, R.
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed
Keywords :
VLSI; application specific integrated circuits; automatic test equipment; automatic testing; built-in self test; design for testability; error correction codes; fault location; hardware description languages; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; reliability; shift registers; synchronisation; ASIC; Berger code circuits; Hamming codes; availability; checksum circuits; concurrent fault detection circuits; diagnostics; framing circuits; library models; maintenance functions; maintenance registers; modelling; online testing; parameterized VHDL library; reliability; simulation; synthesis; threshold functions; timers; Arithmetic; Circuit faults; Circuit testing; Control systems; Error correction; Libraries; Paramagnetic resonance; Redundancy; Registers; System testing;
Conference_Titel :
Test Conference, 1997. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-4209-7
DOI :
10.1109/TEST.1997.639654
