DocumentCode :
2746099
Title :
New halogen-free laminate for advanced package substrate
Author :
Tanabe, Takahiro ; Irino, Toshio ; Ose, Masahisa ; Sakai, Kazunaga
Author_Institution :
Hitachi Chem. Co. Ltd., Chikusei
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
29
Lastpage :
32
Abstract :
Nowadays, the demand for the printed wiring board (PWB) of the environment harmony type is rising rapidly. We have developed a new halogen-free material with low coefficients of thermal expansion (CTE), which will be applied to the plastic packages such as FC-BGA and CSP. The original resin system and filler treatment technique named FICS (filler interphase control system) were applied to the material. The newly developed halogen-free material named MCL-E-679FG(S) has a higher glass transition temperature (Tg), peel strength, and heat resistance than the conventional halogen-free materials. Their properties are advantageous to the melting temperature rise of the lead-free solder. Another newly developed halogen-free material named MCL-E-679GT has the lower CTE combined with standard glass fabric (E-glass). It has been developed by new resin system. Its advantage is to reduce of PKG warpage, such as package on package (PoP), during the heat process for the chip mounting. In order to meet fine-line formation, we developed profile-free copper foil. With the copper foil of 18 mum thickness, we have formed the fine line of 60 mum or less pitch by the conventional subtractive method. It will be effective for advanced package substrate such as high density CSP.
Keywords :
adhesion; ball grid arrays; copper; flip-chip devices; glass fibres; glass transition; laminates; plastic packaging; printed circuits; resins; semiconductor device packaging; substrates; thermal conductivity; thermal expansion; CSP; Cu; E-glass; FC-BGA; FICS; MCL-E-679FG(S); MCL-E-679GT; PKG warpage; chip mounting; copper foil; environment harmony type PWB; filler interphase control system; filler treatment; fine-line formation; flip-chip assembly; glass fabric; glass transition temperature; heat resistance; high density CSP; laminate material; melting temperature; package on package; package substrate; peel strength; plastic package; printed wiring board; resin system; semiconductor device packaging; size 18 mum; subtractive method; thermal expansion coefficient; Chip scale packaging; Control systems; Copper; Glass; Laminates; Plastic packaging; Resins; Temperature; Thermal expansion; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
Type :
conf
DOI :
10.1109/EMAP.2008.4784221
Filename :
4784221
Link To Document :
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