Title :
19 SSE1 Solid-State Electronics and VLSI
Abstract :
Summary form only for tutorial.
Keywords :
Atomic measurements; CMOS process; CMOS technology; Crystallization; Demodulation; Optical films; Solid state circuits; Tellurium; Temperature; Very large scale integration;
Conference_Titel :
Electrical and Electronics Engineering, 2006 3rd International Conference on
Conference_Location :
Veracruz
Print_ISBN :
1-4244-0402-9
DOI :
10.1109/ICEEE.2006.251838
