DocumentCode
2746134
Title
19 SSE1 Solid-State Electronics and VLSI
fYear
2006
fDate
6-8 Sept. 2006
Firstpage
56
Lastpage
58
Abstract
Summary form only for tutorial.
Keywords
Atomic measurements; CMOS process; CMOS technology; Crystallization; Demodulation; Optical films; Solid state circuits; Tellurium; Temperature; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Electronics Engineering, 2006 3rd International Conference on
Conference_Location
Veracruz
Print_ISBN
1-4244-0402-9
Type
conf
DOI
10.1109/ICEEE.2006.251838
Filename
4018066
Link To Document