DocumentCode :
2746330
Title :
The contact stress analysis of the ferrule-hub assembly used in the photonic device packaging
Author :
Lin, Samuel I En ; Chen, Yu Kai
Author_Institution :
Dept. of Power Mech. Eng., Nat. Formosa Univ., Yunlin
fYear :
2008
fDate :
22-24 Oct. 2008
Firstpage :
72
Lastpage :
75
Abstract :
Fiber-to-the-premise architectures, by their nature, require numerous fiber connections for distribution of services to multiple home and business locations. The higher performance of angle-polished connection (APCs) in the outside plant (OSP) environment has widely used in FTTP network. The APC ferrule-hub assembly is an essential part in the device components, such as connectors and transceivers in the optical network. The defect modes in such ferrule-hub include epoxy leakage, contact surface crack, ferrule drop out, which result in device failure and optical signal disconnection. In this study, we first investigated on ferrule stress distribution which caused by the hub design and interference tolerance. The commercial available MSC.Marc program was used in this contact stress analysis. We further demonstrate that fixture and hub designs, apply force velocity and ferrule geometric imperfection can greatly alter the contact stress in the ferrule tip. Such optimal parameters were integrated into our automatic machine to show the good agreement between theoretical study and experimental work.
Keywords :
assembling; electronics packaging; fixtures; mechanical contact; stress analysis; surface cracks; FTTP network; MSC.Marc program; angle-polished connection; connectors; contact stress analysis; contact surface crack; defect modes; epoxy leakage; ferrule drop out; ferrule-hub assembly; fixture; force velocity; geometric imperfection; interference tolerance; optical network; outside plant environment; photonic device packaging; stress distribution; transceivers; Assembly; Business; Connectors; Contacts; Optical devices; Optical fiber devices; Optical fiber networks; Packaging; Stress; Transceivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
Type :
conf
DOI :
10.1109/EMAP.2008.4784232
Filename :
4784232
Link To Document :
بازگشت