• DocumentCode
    2746699
  • Title

    Analysis of flip-chip corner delamination using 3-D virtual crack closure technique

  • Author

    Chiu, Tz-Cheng ; Lin, Huang-Chun ; Yang, Hung-Chun

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    The problem of an overmolded flip-chip containing a die-underfill interface corner crack subjected to thermo-mechanical loading is investigated by using finite element simulation. The fracture mechanics parameters including the stress intensity factors and strain energy release rate along the corner crack front are determined by using a three-dimensional virtual crack closure technique. Effect of the interface corner crack shape on the propensity of crack propagation is discussed.
  • Keywords
    cracks; delamination; finite element analysis; flip-chip devices; fracture mechanics; 3-D virtual crack closure technique; crack propagation; finite element simulation; flip-chip corner delamination; fracture mechanics; interface corner crack shape; strain energy release rate; stress intensity factors; three-dimensional virtual crack closure technique; Capacitive sensors; Delamination; Equations; Finite element methods; Mechanical engineering; Packaging; Shape; Silicon; Thermal stresses; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784253
  • Filename
    4784253