DocumentCode
2746699
Title
Analysis of flip-chip corner delamination using 3-D virtual crack closure technique
Author
Chiu, Tz-Cheng ; Lin, Huang-Chun ; Yang, Hung-Chun
Author_Institution
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan
fYear
2008
fDate
22-24 Oct. 2008
Firstpage
157
Lastpage
160
Abstract
The problem of an overmolded flip-chip containing a die-underfill interface corner crack subjected to thermo-mechanical loading is investigated by using finite element simulation. The fracture mechanics parameters including the stress intensity factors and strain energy release rate along the corner crack front are determined by using a three-dimensional virtual crack closure technique. Effect of the interface corner crack shape on the propensity of crack propagation is discussed.
Keywords
cracks; delamination; finite element analysis; flip-chip devices; fracture mechanics; 3-D virtual crack closure technique; crack propagation; finite element simulation; flip-chip corner delamination; fracture mechanics; interface corner crack shape; strain energy release rate; stress intensity factors; three-dimensional virtual crack closure technique; Capacitive sensors; Delamination; Equations; Finite element methods; Mechanical engineering; Packaging; Shape; Silicon; Thermal stresses; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3620-0
Electronic_ISBN
978-1-4244-3621-7
Type
conf
DOI
10.1109/EMAP.2008.4784253
Filename
4784253
Link To Document