• DocumentCode
    2746815
  • Title

    Influence of lanthanum addition on microstructure and properties of Sn-3.5Ag solder system

  • Author

    Lee, Hwa-Teng ; Chen, Yin-Fa ; Hong, Ting-Fu ; Huang, Yu-Jing

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    The goal of this research is to evaluate the effects of La addition on the microstructure and microhardness of Sn-Ag based solders. Sn-3.5Ag-xLa ternary alloy solder were prepared by adding 0-1.0 wt% La into a Sn-3.5Ag alloy. Copper substrates were then dipped into these solders and aged at 150degC for up to 625 hours. The microstructure and microhardness of the as solidified solder and the aged solder/copper couples were investigated. Experimental results show that Sn-3.5Ag-xLa solders are composed of beta-Sn, Ag3Sn and LaSn3 phases, and their microstructure is refined with La addition. After isothermal aging, Ag3Sn and IMC layer can be effectively depressed by adding a small amount of La element, and the size and amount of LaSn3 compounds did not change perceptibly with storage time. The addition of La increased the microhardness of the Sn-Ag solder due to the refining effect of Ag3Sn particles in eutectic and increased formation of LaSn3 compound. After isothermal storage, the microhardness of solders was decreased with the increasing coarsening of Ag3Sn compounds as aging time was increased. However, coarsening of Ag3Sn compounds was retarded by La addition as revealed in this study. Therefore, La addition helped to improve the microhardness and thermal resistance of the solder joints.
  • Keywords
    ageing; alloying additions; eutectic structure; lanthanum alloys; microhardness; silver alloys; solders; solidification; thermal resistance; tin alloys; Ag3Sn; LaSn3; SnAgLa; aged solder-copper couples; ageing; coarsening; copper substrates; eutectic state; isothermal aging; lanthanum addition; microhardness; microstructure; refining effect; solidified solder; temperature 150 degC; ternary alloy solder; thermal resistance; time 625 h; Aging; Copper; Lanthanum; Mechanical engineering; Mechanical factors; Microstructure; Optical materials; Optical microscopy; Soldering; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784259
  • Filename
    4784259