• DocumentCode
    2746830
  • Title

    Size and substrate effects on microstructure and shear properties of solder joints

  • Author

    Lee, Gwo-Wei ; Song, Jenn-Ming ; Yi-Shao Lai ; Chiu, Ying-Ta ; Su, Chien-Wei

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Dong Hwa Univ., Hualien
  • fYear
    2008
  • fDate
    22-24 Oct. 2008
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    Considering that the mechanical behavior plays a very important role in the packaging reliability, this study examined the shear deformation properties of pure Sn joints with different substrate materials and various gap sizes. The proeutectic Sn dendrites were refined and the shear strength was increased with a shrunken sample gap. The interfacial intermetallic compounds (IMCs) were thickened slightly when the sample gap was less than 100 mum. A decrease in joint thickness transformed the fracture paths of the Cu/Sn/Cu samples from solder bulk to the boundary between interfacial IMC and the solder. As for the Cu/Sn/Ni sandwich structured joints, they exhibited an asymmetrical structure which resulted from the interaction of substrate elements and thus inferior shear strength compared to the Cu/Sn/Cu samples with the same thickness, as well as the difference in fracture mode.
  • Keywords
    chemical interdiffusion; copper; dendrites; dendritic structure; eutectic structure; fracture; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; nickel; shear deformation; shear strength; solders; tin; Cu-Sn-Cu; Cu-Sn-Ni; IC packaging; asymmetrical structure; fracture mode; gap size; interfacial intermetallic compounds; microelectronic interconnections; packaging reliability; proeutectic dendrites; sandwich structured joint; shear deformation; shear strength; solder; solder joint microstructure; Bars; Flip chip; Intermetallic; Joining materials; Mechanical factors; Microstructure; Reliability engineering; Soldering; Substrates; Tin; shear deformation; size effect; solder joint; substrate effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3620-0
  • Electronic_ISBN
    978-1-4244-3621-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2008.4784260
  • Filename
    4784260