Title :
Use of frequency standards in TAI: Present and future
Author :
Petit, G. ; Panfilo, G.
Author_Institution :
Bur. Int. des Poids et Mesures, Sèvres, France
Abstract :
In this paper we study the performance of the ensemble of high accuracy primary frequency standards (PFS) that ensure the accuracy of International Atomic Time TAI. We analyze the statistics of the results of PFS evaluations compared to their stated uncertainties and we discuss the different components of the uncertainty. We also consider the use of secondary frequency standards for the same purpose. Finally we envision the evolutions brought by a coming generation of new ultra-accurate standards and the problems that need to be solved for their future usage in TAI.
Keywords :
atomic clocks; frequency standards; measurement uncertainty; International Atomic Time; TAI; measurement uncertainty; primary frequency standards; ultraaccurate standard; Accuracy; Atomic clocks; Silicon; Standards; Time frequency analysis; Uncertainty; Accuracy; Frequency standards; TAI; TT(BIPM); Timescale;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250861