Title :
Noise and cross-correlation spectra of quantum hall devices
Author :
Schurr, J. ; Pierz, K. ; Callegaro, L. ; Ortolano, M.
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
A two-channel analog-to-digital converter was used to investigate the noise of the cryogenic quantum Hall resistance. Without applied current, only thermal Johnson-Nyquist noise is present. With applied current, excess noise due to dissipation bursts appears which dramatically increases with the non-integer fraction of the filling factor.
Keywords :
analogue-digital conversion; electric resistance measurement; measurement standards; noise measurement; quantum Hall effect; resistors; thermal noise; thermal variables measurement; cross correlation spectra; cryogenic quantum Hall resistance; filling factor; noise spectra; noninteger fraction; quantum Hall devices; thermal Johnson-Nyquist noise; two channel analog-digital converter; Current measurement; Electrical resistance measurement; Filling; Noise; Noise measurement; Preamplifiers; Resistance; Quantum Hall effect; colored noise; correlation; noise measurement; white noise;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250865
