Title :
A simple resistive transfer standard to compare the quantized hall resistance to 10 kΩ
Author :
Ibañez, E. ; Raso, F. ; Matías, L. ; Hortelano, A.
Author_Institution :
Centro Espanol de Metrol., Tres Cantos, Spain
Abstract :
This paper describes a new resistive transfer standard developed at CEM. It lets highly accurate comparison between the quantized Hall resistance and a 10 kΩ conventional standard with the help of an external Hamon device. With only 4 elements and without any switching, it´s the simplest device of this type until now.
Keywords :
transfer standards; CEM; external Hamon device; quantized Hall resistance; resistance 10 kohm; resistive transfer standard; Current measurement; Electrical resistance measurement; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; Hamon network; Quantum Hall Effect; Resistance; Resistive Transfer Standard; uncertainty;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250866
