DocumentCode
2747069
Title
A simple resistive transfer standard to compare the quantized hall resistance to 10 kΩ
Author
Ibañez, E. ; Raso, F. ; Matías, L. ; Hortelano, A.
Author_Institution
Centro Espanol de Metrol., Tres Cantos, Spain
fYear
2012
fDate
1-6 July 2012
Firstpage
191
Lastpage
192
Abstract
This paper describes a new resistive transfer standard developed at CEM. It lets highly accurate comparison between the quantized Hall resistance and a 10 kΩ conventional standard with the help of an external Hamon device. With only 4 elements and without any switching, it´s the simplest device of this type until now.
Keywords
transfer standards; CEM; external Hamon device; quantized Hall resistance; resistance 10 kohm; resistive transfer standard; Current measurement; Electrical resistance measurement; Resistance; Resistors; Standards; Temperature measurement; Uncertainty; Hamon network; Quantum Hall Effect; Resistance; Resistive Transfer Standard; uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location
Washington, DC
ISSN
0589-1485
Print_ISBN
978-1-4673-0439-9
Type
conf
DOI
10.1109/CPEM.2012.6250866
Filename
6250866
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