Title :
Active-arm resistance bridge with voltage null-detection for precision measurement of resistances above 1 MΩ
Author :
Rietveld, Gert ; Van der Beek, Jan
Author_Institution :
VSL, Delft, Netherlands
Abstract :
A high-ohmic bridge for automated resistance measurements in the range between 1 MΩ and 100 GΩ is described. Whereas similar setups reported so far use current null-detection, the present bridge uses voltage null-detection leading to excellent results and uncertainties. For example, the measurement of the 1:100 ratio of a 100 MΩ Hamon device agrees within (0.5 ± 0.4) μΩ/Ω with the nominal value. The total measurement uncertainty at 1 GΩ equals 1.9 μΩ/Ω (k = 1), which has been confirmed in a recent international comparison.
Keywords :
bridge instruments; electric resistance measurement; Hamon device; active arm resistance bridge; high ohmic bridge; precision resistance measurement; resistance 1 Mohm to 100 Gohm; voltage null detection; Bridge circuits; Current measurement; Electrical resistance measurement; Resistance; Resistors; Uncertainty; Voltage measurement; high-ohmic measurement; null-detector; resistance; resistance measurements; resistors; small currents; standard; transfer standard;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2012 Conference on
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4673-0439-9
DOI :
10.1109/CPEM.2012.6250870
