Title : 
Fully-scalable fault-tolerant simulations for BSP and CGM
         
        
            Author : 
Kim, Sung-Ryul ; Park, Kunsoo
         
        
            Author_Institution : 
Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
         
        
        
        
        
        
            Abstract : 
In this paper we consider general simulations of algorithms designed for fully operational BSP and CGM machines on machines with faulty processors. The faults are deterministic (i.e., worst-case distributions of faults are considered) and static (i.e., they do not change in the course of computation). We assume that a constant fraction of processors are faulty. We present a deterministic simulation (resp. a randomized simulation) that achieves constant slowdown per local computations and O((logh p)2) (resp. O(logh  p)) slowdown per communication round, provided that a deterministic preprocessing is done that requires O((logh p) 2) communication rounds and linear (in h) computation per processor in each communication round. Our results are fully-scalable over all values of p from θ(1) to θ(n). Furthermore, our results imply that for p⩽nε (ε<1), algorithms can be made resilient to a constant fraction of processor faults without any asymptotic slowdown
         
        
            Keywords : 
computational complexity; concurrency theory; fault tolerant computing; parallel algorithms; parallel machines; parallel programming; BSP; CGM; deterministic simulation; fault-tolerant simulations; faulty processors; randomized simulation; Algorithm design and analysis; Computational modeling; Computer networks; Concurrent computing; Design engineering; Electrostatic precipitators; Fault tolerance; Hardware; Phase change random access memory; User-generated content;
         
        
        
        
            Conference_Titel : 
Parallel Processing, 1999. 13th International and 10th Symposium on Parallel and Distributed Processing, 1999. 1999 IPPS/SPDP. Proceedings
         
        
            Conference_Location : 
San Juan
         
        
            Print_ISBN : 
0-7695-0143-5
         
        
        
            DOI : 
10.1109/IPPS.1999.760445