Title :
The microstructure and fracture behavior of Sn-3Ag-0.5Cu solder joints
Author :
Wang, T.S. ; Liu, S.C. ; Huang, Y.L. ; Lin, K.L. ; Lai, Y.S.
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
Ball impact test and ball shear test have been used to investigate the joint strength. The joint strength of lead and lead-free solder joints under high strain rate condition were examined. Microstructure in the as-reflowed condition and fracture surfaces were investigated. The intermetallic compounds of Sn-3Ag-0.5Cu joints demonstrated as layer-type (Cu, Ni)6Sn5. Fractographies show that all of Sn37Pb solder joints exhibit the ductile fracture mode in both tests. On the other hand, Sn-3Ag-0.5Cu solder joints exhibit the interfacial fracture mode. The characteristic curve in both tests could demonstrate the failure feature. The ductile fracture behavior exhibits a long displacement and high fracture energy in both tests. The interfacial fracture behavior exhibits a short range displacement and low fracture energy during the test.
Keywords :
copper alloys; crystal microstructure; ductile fracture; fractography; fracture; impact testing; interface structure; silver alloys; solders; tin alloys; SnAgCu; ball impact test; ball shear test; displacement; ductile fracture mode; fractography; fracture energy; fracture surface; interfacial fracture; intermetallic compound; joint strength; solder joint microstructure; strain rate; Environmentally friendly manufacturing techniques; Gold; Intermetallic; Lead; Microstructure; Soldering; Surface cracks; Surface finishing; Surface morphology; Testing;
Conference_Titel :
Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-3620-0
Electronic_ISBN :
978-1-4244-3621-7
DOI :
10.1109/EMAP.2008.4784286