• DocumentCode
    2747476
  • Title

    How good is your blind spot sampling policy

  • Author

    Menzies, Tim ; di Stefano, Justin S.

  • Author_Institution
    Lane Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., USA
  • fYear
    2004
  • fDate
    25-26 March 2004
  • Firstpage
    129
  • Lastpage
    138
  • Abstract
    Assessing software costs money and better assessment costs exponentially more money. Given finite budgets, assessment resources are typically skewed towards areas that are believed to be mission critical. This leaves blind spots: portions of the system that may contain defects which may be missed. Therefore, in addition to rigorously assessing mission critical areas, a parallel activity should sample the blind spots. This paper assesses defect detectors based on static code measures as a blind spot sampling method. In contrast to previous results, we find that such defect detectors yield results that are stable across many applications. Further, these detectors are inexpensive to use and can be tuned to the specifics of the current business situations.
  • Keywords
    formal specification; program verification; sampling methods; software metrics; automatic formal methods; black box probing; blind spot sampling; defect detectors; formal specification; public domain defect data; software assessment; Aerospace engineering; Computer science; Costs; Detectors; Mission critical systems; NASA; Project management; Proposals; Sampling methods; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Assurance Systems Engineering, 2004. Proceedings. Eighth IEEE International Symposium on
  • ISSN
    1530-2059
  • Print_ISBN
    0-7695-2094-4
  • Type

    conf

  • DOI
    10.1109/HASE.2004.1281737
  • Filename
    1281737